Dr Fahimeh Jafari
Name | Dr Fahimeh Jafari |
---|---|
ORCID | https://orcid.org/0000-0001-7366-157X |
Job title | Senior Lecturer |
Email address | fahimeh@uel.ac.uk |
Research institute | Architecture, Computing & Engineering |
Research outputs
Probabilistic Crash Prediction and Prevention of Vehicle Crash
Jafari, F. and Annadi, L. 2024. Probabilistic Crash Prediction and Prevention of Vehicle Crash. International Journal of Transport and Vehicle Engineering. 18 (8), pp. 273-293.Forecasting Bitcoin Prices in the Context of the COVID-19 Pandemic Using Machine Learning Approaches
Sontakke, P., Jafari, F., Saeedi, M. and Amirhosseini, M. 2024. Forecasting Bitcoin Prices in the Context of the COVID-19 Pandemic Using Machine Learning Approaches. ICDAM-2023: 4th International Conference on Data Analytics & Management. London, UK 23 - 24 Jun 2023 Springer. https://doi.org/10.1007/978-981-99-6544-1_7Road Safety in Great Britain: An Exploratory Data Analysis
Choudhary, J. K., Rayala, N., Kiasari, A. E. and Jafari, F. 2023. Road Safety in Great Britain: An Exploratory Data Analysis. International Journal of Transport and Vehicle Engineering. 17 (7), pp. 273-287.Designing a Cost-Efficient Network for a Small Enterprise
Jafari, F., Karami, A. and Osemwengie, L. 2021. Designing a Cost-Efficient Network for a Small Enterprise. SAI Computing Conference 2021. Online 15 - 16 Jul 2021 Springer, Cham. https://doi.org/10.1007/978-3-030-80119-9_14Weighted Round Robin Configuration for Worst-Case Delay Optimization in Network-on-Chip
Jafari, F., Jantsch, Axel and Lu, Zhonghai 2016. Weighted Round Robin Configuration for Worst-Case Delay Optimization in Network-on-Chip. IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 24 (12), pp. 3387-3400. https://doi.org/10.1109/TVLSI.2016.2556007Least Upper Delay Bound for VBR Flows in Networks-on-Chip with Virtual Channels
Jafari, F., Lu, Zhonghai and Jantsch, Axel 2015. Least Upper Delay Bound for VBR Flows in Networks-on-Chip with Virtual Channels. Transactions on Design Automation of Electronic Systems. 20 (3).891
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